High resolution morphological changes of Cu, Ni, Al, and Au surfaces due to atmospheric corrosion

Félix Echeverría; Carlos Alberto Botero; Esteban Correa; Dayana Meza; Juan Guillermo Castaño; Maryory Astrid Gõmez

doi:10.1109/TDMR.2017.2681280

High resolution morphological changes of Cu, Ni, Al, and Au surfaces due to atmospheric corrosion

Félix Echeverría, Carlos Alberto Botero, Esteban Correa, Dayana Meza, Juan Guillermo Castaño, Maryory Astrid Gõmez

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

© 2017 IEEE. As atmospheric corrosion of electrical contacts is a common cause of failure in electronics industry and at the same time miniaturization is a requirement in any modern electronic device, it is important to study the effects of corrosion in the surface morphology of metals widely used in that industry sector, such as gold, copper, nickel, and aluminium. Here, atomic force microscopy (AFM) has been used with that purpose, analysing flat surfaces of those metals both before and after exposure by several weeks to the effects of a contaminated atmosphere containing both NO2and SO2at constant temperature and humidity. Results indicate all metals suffered changes both in surface morphology and roughness. AFM phase mode images also indicated the occurrence of different species on the Ni and Cu surfaces after 11 weeks of exposure. Evidence of defects due to the corrosion attack was only observed for Ni.

Original language	American English
Pages (from-to)	331-339
Number of pages	9
Journal	IEEE Transactions on Device and Materials Reliability
DOIs	https://doi.org/10.1109/TDMR.2017.2681280
State	Published - 1 Jun 2017

Product types of Minciencias

A2 article - Q2

Access to Document

10.1109/TDMR.2017.2681280

https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85025824338&origin=inward

Cite this

@article{6bbbc6c1ddb048dbb5e1b2735a82e5d1,

title = "High resolution morphological changes of Cu, Ni, Al, and Au surfaces due to atmospheric corrosion",

abstract = "{\textcopyright} 2017 IEEE. As atmospheric corrosion of electrical contacts is a common cause of failure in electronics industry and at the same time miniaturization is a requirement in any modern electronic device, it is important to study the effects of corrosion in the surface morphology of metals widely used in that industry sector, such as gold, copper, nickel, and aluminium. Here, atomic force microscopy (AFM) has been used with that purpose, analysing flat surfaces of those metals both before and after exposure by several weeks to the effects of a contaminated atmosphere containing both NO2and SO2at constant temperature and humidity. Results indicate all metals suffered changes both in surface morphology and roughness. AFM phase mode images also indicated the occurrence of different species on the Ni and Cu surfaces after 11 weeks of exposure. Evidence of defects due to the corrosion attack was only observed for Ni.",

author = "F{\'e}lix Echeverr{\'i}a and Botero, {Carlos Alberto} and Esteban Correa and Dayana Meza and Casta{\~n}o, {Juan Guillermo} and G{\~o}mez, {Maryory Astrid}",

year = "2017",

month = jun,

day = "1",

doi = "10.1109/TDMR.2017.2681280",

language = "American English",

pages = "331--339",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - High resolution morphological changes of Cu, Ni, Al, and Au surfaces due to atmospheric corrosion

AU - Echeverría, Félix

AU - Botero, Carlos Alberto

AU - Correa, Esteban

AU - Meza, Dayana

AU - Castaño, Juan Guillermo

AU - Gõmez, Maryory Astrid

PY - 2017/6/1

Y1 - 2017/6/1

N2 - © 2017 IEEE. As atmospheric corrosion of electrical contacts is a common cause of failure in electronics industry and at the same time miniaturization is a requirement in any modern electronic device, it is important to study the effects of corrosion in the surface morphology of metals widely used in that industry sector, such as gold, copper, nickel, and aluminium. Here, atomic force microscopy (AFM) has been used with that purpose, analysing flat surfaces of those metals both before and after exposure by several weeks to the effects of a contaminated atmosphere containing both NO2and SO2at constant temperature and humidity. Results indicate all metals suffered changes both in surface morphology and roughness. AFM phase mode images also indicated the occurrence of different species on the Ni and Cu surfaces after 11 weeks of exposure. Evidence of defects due to the corrosion attack was only observed for Ni.

AB - © 2017 IEEE. As atmospheric corrosion of electrical contacts is a common cause of failure in electronics industry and at the same time miniaturization is a requirement in any modern electronic device, it is important to study the effects of corrosion in the surface morphology of metals widely used in that industry sector, such as gold, copper, nickel, and aluminium. Here, atomic force microscopy (AFM) has been used with that purpose, analysing flat surfaces of those metals both before and after exposure by several weeks to the effects of a contaminated atmosphere containing both NO2and SO2at constant temperature and humidity. Results indicate all metals suffered changes both in surface morphology and roughness. AFM phase mode images also indicated the occurrence of different species on the Ni and Cu surfaces after 11 weeks of exposure. Evidence of defects due to the corrosion attack was only observed for Ni.

U2 - 10.1109/TDMR.2017.2681280

DO - 10.1109/TDMR.2017.2681280

M3 - Article

SN - 1530-4388

SP - 331

EP - 339

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

ER -

High resolution morphological changes of Cu, Ni, Al, and Au surfaces due to atmospheric corrosion

Abstract

Product types of Minciencias

Access to Document

Fingerprint

Cite this